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Zumbach Electronics Corp. offers on-line and benchtop instruments that measure outer and inner diameters and wall thickness by means of noncontact laser, ultrasonic, and x-ray technology. Features include statistic-based closed-loop control, FFT analysis, the generation of process validation data, and comprehensive SQC and SPC reporting. Noncontact triple-plane lump and neck-down detectors are also available.
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