
Session 202 : Lean Six Sigma for Quality Manufacturing |
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Lean Six Sigma Application Moderator:S. Manivannan, Americas Quality Coach, Ford Motor Company Lean Six Sigma By Using PLM- Kamal Ajitsana, Practice Head, Manufacturing, IT, and
Chandrasekaran Nambi, Director, Business Operations, Geometric Americas, Inc. Leading Lean Six Sigma Projects for Quality Manufacturing- Jeff 'SKI' Kinsey, Partner and Senior Consultant, Throughput.us LLC Leveraging Lean with Six Sigma is the "Best Practices" of quality manufacturing for our present times. However, there is more required for successful projects than simply "the will to succeed". Leadership requires passion in addition to great tools. Leadership also requires action: the proper action at exactly the perfect time. Every time, Faster than circumstances can deteriorate! Cycle through your Lean Six Sigma toolbox turbocharged by Colonel John Boyd's OODA Loop (Observe-Orient-Decide-Act) to ensure mission critical successes for each and every project on your plate. Learn of real life applications of the OODA Loop. Observe: unfolding circumstances; internal and external data; implicit guidance & control Leaders produce. Effective leaders produce the desired results. Lean Six Sigma leaders empowered by Boyd's OODA Loop exceed expectations by mastering the four criteria for accuracy inherit in projects: accuracy relative to duration, to logistics, to costs and to the deliverables.
Six Sigma for Small Companies-Jim Akers, Customer Qality Engineer, Woodward
Six Sigma is usually considered for large corporations with significant resources and a large number people to fill the role of Champions, Black Belts and Green Belts. A small business can apply the Six Sigma methodology in their business environment and achieve similar improvement and savings. Metrological Aspects of Six Sigma Applications-Maria Stoleova, President, Integrated Quality Strategies Corporation/University of Calgary
Six Sigma drives the company’s goals toward fewer defects and higher levels of quality and customer satisfaction. To monitor the success of the company to achieve these goals, it is critical to properly measure and confirm the quality of materials, parts, and processes. The common feature of measurements occurring during any type of product quality inspection or statistical process control is the comparison of a measurement result against a value determined by a specification or calculated process limit. This allows us to identify the conformance of the product to established requirements or the presence of the stage of statistical control for processes. Most of the currently used metrological guidelines determine measurement accuracy, stability, repeatability, reproducibility, etc. as absolute values without regard to other parameters of a metrological system. For example, according to these guidelines, the more accurate the system is the better it is. However, the increased accuracy ultimately gives the rise to economic issues such as more expensive measurement equipment, extended inspection time, and as a result, increased costs of measurement operations. So, how can we optimize the measurement system with the goals of increasing accuracy and reducing measurement costs? This article offers the criteria based on Type I (rejection of a good part) and Type II (acceptance of a defective part) errors occurring during the quality control. The paper shows how the criteria can connect accuracy and measurement costs related to re-work (Type I error) or warranty (Type II error). Surpassing Six Sigma: Attaining 10σ & Beyond-Robert Rhyder, President, Rhyder Association, Inc.
It is possible to perform beyond the 3.4 ppm level associated with Six Sigma on a routine basis, often by many orders of magnitude. Achieving extreme levels of performance is a natural consequence of reaching a state of complete process knowledge, i.e., a state where a comprehensive understanding of all significant process input/output relationships is developed for all relevant quality characteristics of the process output. Complete process knowledge, or CPK, frequently leads to performance at “double-digit” standard deviation levels (abbreviated as ddσ or d2σ). 1) TOPS Processes optimized via this methodology will cost less and often have demonstrated the ability to run at 10, 20, or even 30σ levels when compared to original engineering specifications. |
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