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Instructors: Charles Smith, Sr. Engineering Manager, Varian Security and Inspecition Products;
Kathleen Brokdorf, Application Engineer, Phoenix X-ray Systems and Services, Inc.; Thomas Nora, Product Manager, IMTEC Corp., Hytec Division; Jose Torres, Sr., Software Engineer, Carl Zeiss IMT
9:00 AM — 10:00 AM
CMM Grade CT Inspection Workshop
Topics include:
- How CT functions
- First article inspection with CT
- Measurement accuracy with CT
- Flaw detection with CT
- New design features of CMM-CT
- Performance improvements
10:00 AM — 11:00 AM
Precision 3D Metrology with High Resolution CT
Topics include:
- Principles of Computed Tomography (CT)
- System requirements for highest resolution CT
- CT as a new tool for 3D metrology of internal object surfaces
- New correction methods to improve CT quality
- Comparison of different methods for surface extraction
- Comparison study: determination of the precision of different CT-systems used for metrology
- Suitability of CT systems to be used as CMMs
11:00 AM- 12:00 PM
Cone Beam Computed Tomography (CCBCT) in Quality Measurements and Metrology Studies
Topics include:
- Background of 3D x-ray imaging and CT
- Advances in CBCT algorithms
- Current Hardware Innovations in CBCT
- New uses of CBCT for modern QA processes examples of industrial applications
- Trends for the next 5 years
2:00 PM - 4:00 PM
CMM’s (Coordinate Measuring Machine) Within Factory Automation Cells
Topics include:
- Principles of design
- Requires shop hardened or environmentally isolated CMM
- Known interfaces can be implemented quickly
- Reduced cost of software error proofing by OEM
- Single OEM ownership
- ID data, part status, feedback control
- OEM designed interface and cabling
- Increased cost for software error proofing by OEM
- Dual OEM ownership issue
- PC based CMMs need to develop own drivers for RF tags/barcodes
- What’s the future of an F.A. CMM?
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