2008 Quality Expo Detroit Conference
Wednesday, June 11, 2008
Session 103 : Statistical Process Control
Instructors: Steven Wachs, Principal Statistician, Integral Concepts, Inc.; Douglas Fair, Vice President, Statistical Applications, Infinity QS; Steve Gruler, President, Global Quality Consultants
9:00 AM — 12:00 PM
Key Concepts in Statistical Process Control
Topics include:
  • Common SPC misapplication
  • Importance of understanding & reducing variation
  • Problem prevention (process control) vs. reaction (product inspection)
  • Process stability vs. process capability
  • Creating and interpreting control charts
  • Implications (assessing capability without stability, assuming normality when it's not warranted, and the use of specification limits on control charts)
2:00 PM — 3:00 PM
SPC: The Top 10 Mistakes to Avoid
Topics include:
  • A 20-year retrospective on SPC system foibles that can sink any SPC implementation
  • What NOT to do when creating a successful SPC System
  • Real-life examples of SPC system errors, miscues and mistakes
3:00 PM — 4:00 PM
Minimizing Risk to Your Brand with SPC Driven
Topics include:
  • Determine and proactively manage risk to your brand
  • Move from an "inspect and reject" environment to a far more beneficial "predict and prevent" environment
  • Determine the parts-per-million level of product quality going out the back door of your production sites
  • Effectively manage suppliers to pre-defined risk levels
  • Develop practical company-wide quality metrics as an alternative to reacting to customer complaints
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