Conference
Monday, May 5, 2008
Session 102: Basics and Applications of Particle Characterization
Basics and Applications of Particle Characterization- Remi Trottier, Technical Specialist, Analytical Sciences,The Dow Chemical Company; Stewart Wood, Research Leader, Analytical Sciences Laboratory, The Dow Chemical Company Given the wide range of technologies available for particle size and shape characterization, selection of the best technology for a particular application is not a trivial task. This tutorial will cover the basics of particle size characterization along with several of the latest commercially available technologies. The participants will acquire the knowledge necessary for proper instrument selection, data interpretation, and instrument evaluation.
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