Monday, May 5, 2008


Session 102: Basics and Applications of Particle Characterization
Instructors: Remi Trottier,Technical Specialist, Analytical Sciences,The Dow Chemical Company;Stewart Wood, Research Leader, Analytical Sciences Laboratory,The Dow Chemical Company
9:00 AM - 4:00 PM
Basics and Applications of Particle Characterization
The following topics will be covered:
  • Basic concepts
  • Data representation
  • Number, Surface Area, Volume Distributions
  • Averages
  • Technologies & Data Interpretation
  • Laser Diffraction
  • Sedimentation
  • Image Analysis
  • Dynamic Light Scattering
  • Optical Particle Counting
  • Electrozone Particle Counters
  • Ultrasonic Spectroscopy
  • Sample Delivery Systems
  • Evaluating Instrument Performance