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World's Largest Event for Medical Manufacturing  MD&M East Jacob K. June 3-5 2008 Javits Convention Center New York, NY
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Conference

Thursday, June 5, 2008
9:00 A.M. - 1 P.M.

Session 401 - Validation with Non-normal Data

Instructor: Wayne Taylor, PhD, Founder and Chairman, Taylor Enterprises

This course is designed to help you handle variables sampling plans. Variables sampling plans assume the data fits the normal distribution and are relatively sensitive to departures from normality. This course teaches how to test for normality and how to handle situations when the data is not normal including fitting other distributions and transforming the data. This course is task orientated in that it provides all the knowledge and tools required to handle variables sampling plans. No prior knowledge or special background is required.

What You Will Learn:

  • Answer the question: "Why is normality important?"
  • How to test for normality.
  • How to control false rejections due to large data sets and poor measurement resolution
  • How to handle departures from normality including:
    • Nonnormal distributions (fitting other distribution and transformations)
    • Outliers
    • Subgroups
    • Shifts
    • Truncated data
  • Step-by-Step procedure for executing variable sampling plans

Course Overview:

  • Testing for Normality
  • Reasons for Failing a Normality Test
  • Preventing Failures
  • Handling Failures
  • Handling Variables Sampling plans During Validations (Writing Protocol)
  • Handling Variables Sampling Plans During Manufacturing (Writing Procedure)

Note: this session ends at 1:00 pm.

ABOUT THE INSTRUCTOR

Wayne Taylor, PhD, Founder and Chairman, Taylor Enterprises

Dr. Taylor is the founder and chairman of Taylor Enterprises, Inc. where he is responsible for the development of the VarTran®, Change-Point Analyzer, and Sampling Plan Analyzer software packages as well as providing consulting and training on the Six Sigma approach and tools including Robust Design, Tolerance Analysis, Design of Experiments, SPC, Acceptance Sampling, and Statistics.

In 2000, Dr. Taylor retired from his position as Director of Quality Technologies at Baxter Healthcare Corporation where he was responsible for Baxter's Six Sigma program. He and his staff have trained over 800 of Baxter's engineers to serve as Six Sigma black belts. He had been with Baxter for 22 years.

He is author of the books Optimization and Variation Reduction in Quality and Guide to Acceptance Sampling. The first book outlines the approach implemented at Baxter for achieving six sigma quality. The second book outlines a simple to use approach for selecting and justifying sampling plans as well as reducing inspection costs that is used throughout the medical device industries. This system has saved Baxter over 30 million dollars annually.

Dr. Taylor is the leading expert on acceptance sampling in the pharmaceutical, medical device and diagnostics industries. His articles on selecting statistically valid sampling plans have become standards in the industry and are used by the FDA in their new inspector training. He has taught his 2-day course Successful Acceptance Sampling to over 5,000 students and 50 companies including the CDRH (Center for Devices and Radiological Health) of the FDA.

Dr. Taylor is also a leading expert in Process Validation. He is author of Annex A of the Global Harmonization Task Force guideline titled Process Validation Guidance for Process Validation Engineers.

The VarTran software and Dr. Taylor's course Robust Tolerance Analysis have rapidly become a key component of many companies DFSS (Design for Six Sigma) programs. Honeywell, the Six Sigma Academy and numerous other companies have adopted VarTran as an essential tool for designing high quality products.

He has made many key contributions to the field of Quality including Variation Transmission Analysis, Process Tolerances, Quick Switching Systems and Change-Point Analysis. He has dozens of articles and hundreds of presentations to his credit.

Dr. Taylor received his Ph.D. in Statistics from Purdue University. He is a fellow of the American Society for Quality and the Royal Statistical Society as well as a member of the American Statistical Association (ASA).

 

 

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